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[1] S. Pagano, A. Barone, Supercond. Sci Technol. 10 904-908 (1997)
[2] T. Rhyänen, H. Seppä, J. Low Temp. Phys. 76 Nos. 5/6 287-386 (1989)
[3] M. B. Ketchen, J. M. Jaycox, Appl. Phys. Lett. 40 736 (1982)
[4] M. Tinkham, Introduction to Superconductivity 2nd Ed. (McGraw-Hill, 1996)
[5] R. P. Gifford, J. C. Gallop, B. W. Petley, Progress in Quantum Electronics Vol. 4 Part 4 (Pergamon Press, 1976)
[6] Gallop, J.C. SQUIDs, the Josephson Effect and Superconducting Electronics. Adam Hilger. 1991.
[7] Clarke, John. SQUID - Current Performance of Superconducting Quantum Interference Devices. de Gruyter, 1976.
[8] Zimmerman, Thine and Harding, Design and operation of stable rf-based superconducting point contact devices... J. Appl. Phys. 41, 1572-1580 (1970).
[9] Mercereau, J.E. Superconducting Magnetometers with sensitivities approaching 10-10 G. Rev. Phys. Appl. 5, 21-24 (1970).
[10] Goodman, Hesterman, Rorden and Goree. Superconducting instrument systems. Proc IEEE 61, 20-27 (1973).
[11] H. Abe, K. Hamasaki, K. Kojima, M. Sasaki, Jpn. J. Appl. Phys. 33 3435-3442 (1994)
[12] H. Abe, K. Hamasaki, T. Ishiguro, Jpn. J. Appl. Phys. 33 7210-7213 (1994)
[13] van Duzer, Principals of Superconductive Devices & Circuits.
[14] Applied Physics 68, 1169 (1990)
[15] Journal of Research and Development Vol. 39, No. 6-Proximal probe microscopes.
[16] L.N. Vu, M. S. Wistrom, and D. J. Van Harlingen, Applied Physics Letters 63, 1693 (1993)
[17] Journal of Research and Development Vol. 39, No.6-Proximal probe microscopes.
[18] David W. Abraham, C. C. Williams, and H. K. Wickramasinghe, Applied Physics Letters 53, 1503 (1988).
[19] Superconducting Electronics 106, Wiley (1989).
[20] Heart monitoring with high-Tc d.c. SQUID gradiometers in an unshielded environment. R Weidl et al., Superconducting Science Technology 10, (1997).
[21] A seven-channel high-Tc SQUID-based heart scanner. H J M Brake et al., Measurement Science Technology 8, (1997).
[22] Chen et al, 1987 Phys. Rev. Lett. 58 1972
[23] Chen et al, Trans. on App. Supercon. Vol. 3, No. 1, March 1993, 2333
[24] Picture from Foleg et al, IEEE Trans. on App. Supercon., vol. 3, No. 1, March 1993, 2361
[25] Xiaofan Meng et al, IEEE Trans. on App. Supercon., vol 3, no. 2, June 1995, pp. 2377
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